JIS C 60068-2-27 High Impact Test
High-impact testing for small electronic components can be conducted (the applicable impact range is 10 to 30,000G).
This testing machine is primarily capable of conducting shock tests on small electronic components and similar items. The tests can accommodate sine half waves, trapezoidal waves, sawtooth waves, etc. (in our case, only sine waves), and comply with IEC standards, JIS standards, MIL standards, JEITA (EIAJ) standards, and other internal standards. Depending on the duration of action, the applicable shock range is from 10 to 3,000G. In our case, using a shock amplifier, it can accommodate up to 30,000G. Additionally, this testing machine can easily reproduce a wide range of test conditions (shock acceleration / duration of action) using a pneumatic method. 【Testing Standards】 - JIS C 60068-2-27 - IEC 60068-2-27 - MIL-STD-202 - MIL-STD-810 - MIL-STD-883 - EIAJ ED-4701/400 and others ▼ For more details, please download the PDF document (recommended). ▼ Customers in a hurry, please contact us via the 'Contact Us' section below.
- Company：日本ビジネスロジスティクス（JBL） 藤沢北事業所
- Price：Other
